|
| Company |
TESTECH CO., LTD. |
| CEO |
Young Jae, Jhung |
YEAR
OF FOUNDATION |
1996 |
No. OF
EMPLOYEE |
71 |
| Homepage |
www.testech.co.kr/eng/index.html |
| Address |
625-4 Upsung-Dong, Chunan-Shi Chungchongnam-Do, Korea |
| Listed |
KOSDAQ |
CONTACT
Person |
| Name |
|
|
|
E-Mail |
|
webmaster@testech.co.kr |
|
| Dept |
|
|
|
Tel |
|
82-41-529-3000 |
|
| Title |
|
|
|
Fax |
|
|
|
FINANCIAL
STATUS(2005) |
| Capital(US$) |
|
Sales Revenue(US$) |
|
Exporting Amount(US$) |
|
| 6,700,000 |
|
18,502,000 |
|
|
|
FINANCIAL
STATUS(2006) |
| Capital(US$) |
|
Sales Revenue(US$) |
|
Exporting Amount(US$) |
|
| 6,700,000 |
|
17,747,000 |
|
|
|
| Main Business Field |
Bio |
Main
Products |
Product1 |
| Product Name |
|
TDBI (Test During Burn-In System) |
|
| Description |
|
Burn In Board Size : 450 x 560mm Max 48 Slots/System Dynamic 2K Event Timing Generation All Scan Write on-the-fly & Random Scan 2-Independent VIH Ievel for Clock High Power and Drive Capability Parity Bit Check Available Pattern u-Code Operation without Any Dummy Cycle |
|
| Applicable Area |
|
Focus 7600/7640, Focus 7600F/7640/F |
|
| Overseas Sales |
|
|
|
| Product2 |
| Product Name |
|
WBI (Wafer Burn-In System) |
|
| Description |
|
Algorithmic Pattern Generator. 200mm Wafer Test Control by each driver output channel. Fully Graphical Time Set Editor. Real Time Wafer Sort Map Display. Dynamic 2K Event Edge Timing Generation. Independent 32 Time Set Powerful ALU for Complex Pattern Generation |
|
| Applicable Area |
|
Focus 2000, Focus 3000 |
|
| Overseas Sales |
|
|
|
| Product3 |
| Product Name |
|
TFS |
|
| Description |
|
Programmable Power-Up / Down Sequence Two Power Supplies for VDD, VDDQ Address on Data MUX Capability for Rambus DRAM Operating Current Measure Built In Clamp Circuit on DUT for Protect to Shoot Independent 16 Timeset Three Independent Clock Vih Source |
|
| Applicable Area |
|
TFS 300 |
|
| Overseas Sales |
|
|
|
MAJOR PARTNER
/CUSTOMER |
|
|
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